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PASSAT: efficient SAT-based test pattern generation for industrial circuits

PASSAT: efficient SAT-based test pattern generation for industrial circuits

Shi, Junhao, G. Fey et al., ‘PASSAT’: ‘PASSAT: efficient SAT-based test pattern generation for industrial circuits’, IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI’05), 2005, pp 212–217.

conference paper · https://doi.org/10.1109/ISVLSI.2005.55